Yiting Wu
Yiting Wu, Dr.-Ing.
Forschungsschwerpunkte:
- Weißlichtinterferometrie
- Rasterkraftmikroskopie
Forschungsprojekte:
Publikationen
2021
A metrological atomic force microscope for large range measurements with sub-nanometre resolution
Sensor and Measurement Science International 2021 (Nürnberg, 3. Mai 2021 - 6. Mai 2021)
DOI: 10.5162/SMSI2021/A4.1
URL: https://www.ama-science.org/proceedings/details/3942 , , , :
A metrological atomic force microscope system
In: Nano Express (2021)
ISSN: 2632-959X
DOI: 10.1088/2632-959X/abed5e
URL: https://iopscience.iop.org/article/10.1088/2632-959X/abed5e , , , :
Development of a Metrological Atomic Force Microscope System with Improved Signal Quality
In: Engineering Proceedings (2021)
ISSN: 2673-4591
DOI: 10.3390/I3S2021Dresden-10102 , , , :
Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system
In: Journal of Sensors and Sensor Systems (2021), S. 171-177
ISSN: 2194-8771
DOI: 10.5194/jsss-10-171-2021 , , , :
2020
Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system
Sensor and Measurement Science International (Nuremberg, 22. Juni 2020 - 25. Juni 2020)
In: AMA Service GmbH (Hrsg.): Sensor and Measurement Science International 2020, Wunstorf, Germany: 2020
DOI: 10.5162/SMSI2020/C6.3
URL: https://www.ama-science.org/proceedings/details/3706 , , , :
2017
Precise measurement of large scale surfaces with micro-topographies without overlapping fields of view by white light interferometry
Laser Metrology and Machine Performance XII (Wotton-under-Edge, 15. März 2017 - 16. März 2017)
In: L. Blunt & W. Knapp (Hrsg.): Laser Metrology and Machine Performance XII 2017 , , :