Ute Klöpzig

2021

• Wu Y., Wirthmann E., Klöpzig U., Hausotte T.:
  A metrological atomic force microscope for large range measurements with sub-nanometre resolution
  Sensor and Measurement Science International 2021 (Nürnberg, 3. Mai 2021 - 6. Mai 2021)
  DOI: 10.5162/SMSI2021/A4.1
  URL: https://www.ama-science.org/proceedings/details/3942
• Wu Y., Wirthmann E., Klöpzig U., Hausotte T.:
  A metrological atomic force microscope system
  In: Nano Express (2021)
  ISSN: 2632-959X
  DOI: 10.1088/2632-959X/abed5e
  URL: https://iopscience.iop.org/article/10.1088/2632-959X/abed5e
• Wu Y., Wirthmann E., Klöpzig U., Hausotte T.:
  Development of a Metrological Atomic Force Microscope System with Improved Signal Quality
  In: Engineering Proceedings (2021)
  ISSN: 2673-4591
  DOI: 10.3390/I3S2021Dresden-10102
• Wu Y., Wirthmann E., Klöpzig U., Hausotte T.:
  Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system
  In: Journal of Sensors and Sensor Systems (2021), S. 171-177
  ISSN: 2194-8771
  DOI: 10.5194/jsss-10-171-2021

2020

• Wu Y., Wirthmann E., Klöpzig U., Hausotte T.:
  Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system
  Sensor and Measurement Science International (Nuremberg, 22. Juni 2020 - 25. Juni 2020)
  In: AMA Service GmbH (Hrsg.): Sensor and Measurement Science International 2020, Wunstorf, Germany: 2020
  DOI: 10.5162/SMSI2020/C6.3
  URL: https://www.ama-science.org/proceedings/details/3706

2019

• Schaude J., Albrecht J., Klöpzig U., Gröschl AC., Hausotte T.:
  Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode
  In: Technisches Messen 86 (2019), S. 12-16
  ISSN: 0171-8096
  DOI: 10.1515/teme-2019-0035

2016

• El Melegy A., Hausotte T., Mohammed Abu EY., Mohammed Ahmed A., Weinert B., Klöpzig U.:
  Large Range Self-Sensing Atomic Force Microscope (LR-SAFM) for Surface Topography
  IEEE International Conference on Imaging Systems & Techniques (Chania, Kreta, 4. Oktober 2016 - 6. Oktober 2016)
  In: IEEE IST 2016 Conference Proceeding 2016